A test and diagnosis methodology for RF transceivers
| dc.citation.epage | 138 | en_US |
| dc.citation.spage | 135 | en_US |
| dc.contributor.author | Chen, Hung-kai | en_US |
| dc.contributor.author | Su, Chauchin | en_US |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:12:51Z | |
| dc.date.available | 2014-12-08T15:12:51Z | |
| dc.date.issued | 2007 | en_US |
| dc.description.abstract | This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built-in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise. | en_US |
| dc.identifier.doi | 10.1109/ATS.2007.29 | en_US |
| dc.identifier.isbn | 978-0-7695-2890-8 | en_US |
| dc.identifier.issn | 1081-7735 | en_US |
| dc.identifier.journal | PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/ATS.2007.29 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/9900 | |
| dc.identifier.wosnumber | WOS:000252080600023 | |
| dc.language.iso | en_US | en_US |
| dc.subject | RF test | en_US |
| dc.subject | RF design-for-testability | en_US |
| dc.subject | mixer | en_US |
| dc.subject | low noise amplifier | en_US |
| dc.subject | transceiver | en_US |
| dc.title | A test and diagnosis methodology for RF transceivers | en_US |
| dc.type | Proceedings Paper | en_US |