0.85 微米面射型雷射可靠度與雜訊品質之研究
| dc.contributor.author | 戴國仇 | en_US |
| dc.contributor.department | 國立交通大學光電工程研究所 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:39:23Z | |
| dc.date.available | 2014-12-13T10:39:23Z | |
| dc.date.issued | 1995 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC84-2215-E009-035 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=172350&docId=29298 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/96435 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 0.85 微米面射型雷射可靠度與雜訊品質之研究 | zh_TW |
| dc.title | Reliability Studies and Noise Measurement of 0.85.mu.m Surface Emitting Lasers | en_US |
| dc.type | Plan | en_US |
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