鋁導線的設計對覆晶銲錫電遷移的影響
| dc.contributor.author | 陳智 | en_US |
| dc.contributor.author | Chen Chih | en_US |
| dc.contributor.department | 國立交通大學材料科學與工程學系（所） | zh_TW |
| dc.date.accessioned | 2014-12-13T10:45:43Z | |
| dc.date.available | 2014-12-13T10:45:43Z | |
| dc.date.issued | 2010 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC98-2221-E009-036-MY3 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1997249&docId=327111 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/100427 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 鋁導線的設計對覆晶銲錫電遷移的影響 | zh_TW |
| dc.title | Effect of Al-Trace Design on the Electromigration of Flip-Chip Solder Joints | en_US |
| dc.type | Plan | en_US |
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