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Recent progress of 850nm VCSEL for oeic application

dc.citation.woscount0en_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.date.accessioned2017-04-21T06:49:25Z
dc.date.available2017-04-21T06:49:25Z
dc.date.issued2016en_US
dc.identifier.isbn978-1-4673-9478-9en_US
dc.identifier.issn1930-8868en_US
dc.identifier.journal2016 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA)en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/136430
dc.identifier.wosnumberWOS:000389022000036en_US
dc.language.isoen_USen_US
dc.titleRecent progress of 850nm VCSEL for oeic applicationen_US
dc.typeProceedings Paperen_US

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