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"S-shaped" Photoluminescence Emission Shift in Cu(In,Ga)Se-2 Thin Films

dc.contributor.authorLiao, Y. K.en_US
dc.contributor.authorKuo, S. Y.en_US
dc.contributor.authorLai, F. I.en_US
dc.contributor.authorLin, W. T.en_US
dc.contributor.authorHsieh, D. H.en_US
dc.contributor.authorChiu, D. W.en_US
dc.contributor.authorKuo, H. C.en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:31:51Z
dc.date.available2014-12-08T15:31:51Z
dc.date.issued2012en_US
dc.description.abstractWe have utilized photoluminescence (PL) measurement to investigate carrier recombination mechanism in Cu(In,Ga)Se-2 thin films and observed an S-shaped emission shift revealed from the corresponding PL peak of near band edge transition.en_US
dc.identifier.isbn978-1-4673-6274-0en_US
dc.identifier.issn2162-108Xen_US
dc.identifier.journal2012 ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE (ACP)en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/22500
dc.identifier.wosnumberWOS:000322085900129
dc.language.isoen_USen_US
dc.title"S-shaped" Photoluminescence Emission Shift in Cu(In,Ga)Se-2 Thin Filmsen_US
dc.typeProceedings Paperen_US

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