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RF CMOS之特性量測、模式建立與可靠性研究

dc.contributor.author汪大暉en_US
dc.contributor.authorWANG TAHUIen_US
dc.contributor.department交通大學電子工程系zh_TW
dc.date.accessioned2014-12-13T10:29:41Z
dc.date.available2014-12-13T10:29:41Z
dc.date.issued2000en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC89-2215-E009-034zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=542099&docId=99581en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/89519
dc.language.isozh_TWen_US
dc.subject射頻zh_TW
dc.subject互補式金氧半導體zh_TW
dc.subjectS-參數zh_TW
dc.subject雜訊zh_TW
dc.subject電路模式zh_TW
dc.subject天線效應zh_TW
dc.subject熱電子zh_TW
dc.subjectRFen_US
dc.subjectCMOSen_US
dc.subjectS-parameteren_US
dc.subjectNoiseen_US
dc.subjectCircuit modelen_US
dc.subjectAntenna effecten_US
dc.subjectHot carrieren_US
dc.titleRF CMOS之特性量測、模式建立與可靠性研究zh_TW
dc.titleRF CMOS Characterization, Modeling and Reliability Studyen_US
dc.typePlanen_US

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