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提高光偵測度之光偵測元件及其形成方法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI458105zh_TW
dc.contributor.author陳方中en_US
dc.contributor.author林書丞en_US
dc.date.accessioned2014-12-16T06:16:23Z
dc.date.available2014-12-16T06:16:23Z
dc.date.issued2014-10-21en_US
dc.description.abstract一種光偵測元件之形成方法,包括:提供基板;在基板上形成透明導電薄膜;在透明導電薄膜上形成導電高分子層;在導電高分子層上形成有機主動層;在有機主動層上形成電荷阻擋層;以及在電荷阻擋層上形成陰極金屬。zh_TW
dc.identifier.govdocH01L031/0256zh_TW
dc.identifier.govdocH01L031/18zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/105819
dc.language.isozh_TWen_US
dc.title提高光偵測度之光偵測元件及其形成方法zh_TW
dc.typePatentsen_US

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