熱輻射吸收性薄膜輻射熱性質與厚度之量測與分析
| dc.contributor.author | 林振德 | en_US |
| dc.contributor.author | LIN JENN-DER | en_US |
| dc.contributor.department | 交通大學機械工程系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:51:27Z | |
| dc.date.available | 2014-12-13T10:51:27Z | |
| dc.date.issued | 2000 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC89-2212-E009-022 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=501370&docId=90407 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/102703 | |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 薄膜 | zh_TW |
| dc.subject | 吸收性介質 | zh_TW |
| dc.subject | 頻譜光學常數 | zh_TW |
| dc.subject | 傾斜入射角 | zh_TW |
| dc.subject | Thin film | en_US |
| dc.subject | Absorbing media | en_US |
| dc.subject | Spectral optical constant | en_US |
| dc.subject | Oblique incidence | en_US |
| dc.title | 熱輻射吸收性薄膜輻射熱性質與厚度之量測與分析 | zh_TW |
| dc.title | An Analysis for Simultaneous Measurement of Spectral Optical Constants and Thickness of an Absorbing Thin Film on a Substrate | en_US |
| dc.type | Plan | en_US |