Interface Discrete Trap Induced Variability for Negative Capacitance FinFETs
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Lee, Ho-Pei | en_US |
| dc.contributor.author | Tseng, Kuei-Yang | en_US |
| dc.contributor.author | Su, Pin | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2019-04-02T06:04:21Z | |
| dc.date.available | 2019-04-02T06:04:21Z | |
| dc.date.issued | 2018-01-01 | en_US |
| dc.identifier.issn | 1930-8868 | en_US |
| dc.identifier.journal | 2018 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/150744 | |
| dc.identifier.wosnumber | WOS:000444900700025 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Interface Discrete Trap Induced Variability for Negative Capacitance FinFETs | en_US |
| dc.type | Proceedings Paper | en_US |
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