微結構之顯微電性量測(III)
| dc.contributor.author | 陳衛國 | en_US |
| dc.contributor.author | WEI-KUOCHEN | en_US |
| dc.contributor.department | 交通大學電子物理系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:30:34Z | |
| dc.date.available | 2014-12-13T10:30:34Z | |
| dc.date.issued | 2005 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC94-2112-M009-003 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1109666&docId=210145 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/90339 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 微結構之顯微電性量測(III) | zh_TW |
| dc.title | Studies of Microstructure by Micro-Electrical Characterization Methods(III) | en_US |
| dc.type | Plan | en_US |