半導體-絕緣體-半導體(SIS)異質接面結構應用於光檢測器製備之研究
| dc.contributor.author | 謝宗雍 | zh_TW |
| dc.contributor.author | HSIEH TSUNG-EONG | en_US |
| dc.contributor.department | 國立交通大學材料科學與工程學系（所） | zh_TW |
| dc.date.accessioned | 2016-03-29T00:01:15Z | |
| dc.date.available | 2016-03-29T00:01:15Z | |
| dc.date.issued | 2016 | en_US |
| dc.description.sponsorship | 科技部 | zh_TW |
| dc.identifier.govdoc | MOST104-2221-E009-034-MY3 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=11727176&docId=480948 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/130983 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 半導體-絕緣體-半導體(SIS)異質接面結構應用於光檢測器製備之研究 | zh_TW |
| dc.title | A Study of Semiconductor-Insulator-Semiconductor (SIS) Heterojunction Structure Applied to the Fabrication of Photodetectors | en_US |
| dc.type | Plan | en_US |
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