In Situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Nanostructures
| dc.citation.epage | 1221 | en_US |
| dc.citation.issue | en_US | |
| dc.citation.spage | 1220 | en_US |
| dc.citation.volume | 15 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Chen, L. J. | en_US |
| dc.contributor.author | Wu, W. W. | en_US |
| dc.contributor.department | 材料科學與工程學系 | zh_TW |
| dc.contributor.department | Department of Materials Science and Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:21:40Z | |
| dc.date.available | 2014-12-08T15:21:40Z | |
| dc.date.issued | 2009-07-01 | en_US |
| dc.identifier.doi | 10.1017/S14319276090959688 | en_US |
| dc.identifier.issn | 1431-9276 | en_US |
| dc.identifier.journal | MICROSCOPY AND MICROANALYSIS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1017/S14319276090959688 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/15392 | |
| dc.identifier.wosnumber | WOS:000208119100601 | |
| dc.language.iso | en_US | en_US |
| dc.title | In Situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Nanostructures | en_US |
| dc.type | Article | en_US |
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