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Damage Localization of Structures Identified with a Deterministic - Stochastic Model

dc.citation.epage860en_US
dc.citation.spage856en_US
dc.citation.volume501-504en_US
dc.contributor.authorWang, Yen-Poen_US
dc.contributor.authorChang, Ming-Lianen_US
dc.contributor.authorChang, Jia-Geen_US
dc.contributor.department土木工程學系zh_TW
dc.contributor.departmentDepartment of Civil Engineeringen_US
dc.date.accessioned2014-12-08T15:36:26Z
dc.date.available2014-12-08T15:36:26Z
dc.date.issued2014en_US
dc.description.abstractIn this study, a scheme integrated with deterministic- stochastic subspace system identification and the method of damage localization vector (DLV) is proposed for damage detection of structures based on seismic response data. A series of shaking table tests has been conducted in National Center for Research on Earthquake Engineering (NCREE), Taiwan. Damage condition is simulated by reducing the cross-sectional area of some of the columns at the bottom ends. Both single and multiple damage conditions at various locations have been considered. Full or partial observation conditions have been taken into account in the system identification analysis. It has been shown that local damages (stories) can be identified from global responses of the structure to earthquakes if sufficiently observed.en_US
dc.identifier.doi10.4028/www.scientific.net/AMM.501-504.856en_US
dc.identifier.isbn978-3-03835-005-7en_US
dc.identifier.issn1660-9336en_US
dc.identifier.journalADVANCES IN CIVIL AND STRUCTURAL ENGINEERING III, PTS 1-4en_US
dc.identifier.urihttp://dx.doi.org/10.4028/www.scientific.net/AMM.501-504.856en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/24776
dc.identifier.wosnumberWOS:000339031500170
dc.language.isoen_USen_US
dc.subjectdamage locating vectorsen_US
dc.subjectdeterministic-stochastic subspace systemen_US
dc.subjectshaking table testsen_US
dc.subjectsystem identificationen_US
dc.titleDamage Localization of Structures Identified with a Deterministic - Stochastic Modelen_US
dc.typeProceedings Paperen_US

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