異質接面電晶體的安全操作範圍研究( III )
| dc.contributor.author | 李建平 | zh_TW |
| dc.contributor.author | LEE CHIEN-PING | en_US |
| dc.contributor.department | 國立交通大學電子工程學系及電子研究所 | zh_TW |
| dc.date.accessioned | 2016-03-28T08:17:32Z | |
| dc.date.available | 2016-03-28T08:17:32Z | |
| dc.date.issued | 2015 | en_US |
| dc.description.sponsorship | 科技部 | zh_TW |
| dc.identifier.govdoc | MOST104-2221-E009-004 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=11493320&docId=465503 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/130140 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 異質接面電晶體的安全操作範圍研究( III ) | zh_TW |
| dc.title | Study of Ruggedness and the Safe Operating Area of GaAs Based Heterojunction Bipolar Transistors( III ) | en_US |
| dc.type | Plan | en_US |
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