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Systematic analysis of the offset-PLL output spur spectrum

dc.citation.epage3034en_US
dc.citation.issue9en_US
dc.citation.spage3024en_US
dc.citation.volume53en_US
dc.contributor.authorLee, CFen_US
dc.contributor.authorPeng, STen_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.date.accessioned2014-12-08T15:18:35Z
dc.date.available2014-12-08T15:18:35Z
dc.date.issued2005-09-01en_US
dc.description.abstractThis paper presents a mechanism that explains exactly the cause of spurs at the output of offset-PLL (OPLL) transmitters. By a rigorous analysis of the relationship between the signals and disturbances in OPLL, accurate formulas are obtained which elucidate systematically the intermodulation nature of the output sour spectrum. From the, analysis, it is shown that in practical situations the OPLL spurs are due to the disturbances from the voltage-controlled oscillator leakage, the local oscillator leakage, and the image signal, rather than other spurious products of the offset mixer in the loop as previously explained. The formulas give insight into OPLL circuit design and frequencies accommodation and clearly depict the output spur distribution in the more realistic situation when the input is modulated. Finally, the formulas are verified by some elaborate experiments with extensive numerical results.en_US
dc.identifier.doi10.1109/TMTT.2005.854221en_US
dc.identifier.issn0018-9480en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2005.854221en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/13372
dc.identifier.wosnumberWOS:000231721300045
dc.language.isoen_USen_US
dc.subjectintermodulationen_US
dc.subjectleakageen_US
dc.subjectlocal oscillator (LO)en_US
dc.subjectoffset mixeren_US
dc.subjectoffset-PLL (OPLL)en_US
dc.subjectspursen_US
dc.subjectvoltage-controlled oscillator (VCO)en_US
dc.titleSystematic analysis of the offset-PLL output spur spectrumen_US
dc.typeArticle; Proceedings Paperen_US

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