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CMP晶圓壓力分佈實測技術的研究與應用

dc.contributor.author鄭璧瑩en_US
dc.contributor.department國立交通大學機械工程研究所zh_TW
dc.date.accessioned2014-12-13T10:51:24Z
dc.date.available2014-12-13T10:51:24Z
dc.date.issued2000en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC89-2212-E009-063zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=573413&docId=107055en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/102669
dc.language.isozh_TWen_US
dc.titleCMP晶圓壓力分佈實測技術的研究與應用zh_TW
dc.titleThe Investigation of Measurement Technology on CMP Wafer Pressure Distributionen_US
dc.typePlanen_US

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