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Investigation of beryllium implanted P-type GaN

dc.citation.epage84en_US
dc.citation.issue1-3en_US
dc.citation.spage82en_US
dc.citation.volume82en_US
dc.contributor.authorYu, CCen_US
dc.contributor.authorChu, CFen_US
dc.contributor.authorTsai, JYen_US
dc.contributor.authorWang, SCen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:43:50Z
dc.date.available2014-12-08T15:43:50Z
dc.date.issued2001-05-22en_US
dc.description.abstractWe report the preliminary results of beryllium implanted into P-type GaN and the effects on the characteristic of Mg-doped P-GaN. These samples were implanted with Be ions were implanted with two different energies of 50 and 150 keV at two different doses of similar to 10(13) and 10(14) cm(-2) at room temperature. Surface morphology and photoluminescence measurements are presented. (C) 2001 Elsevier Science B.V. All rights reserved.en_US
dc.identifier.doi10.1016/S0921-5107(00)00751-0en_US
dc.identifier.issn0921-5107en_US
dc.identifier.journalMATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGYen_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0921-5107(00)00751-0en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/29640
dc.identifier.wosnumberWOS:000168618700024
dc.language.isoen_USen_US
dc.subjectberylliumen_US
dc.subjectimplanten_US
dc.subjectGaNen_US
dc.subjectphotoluminescenceen_US
dc.titleInvestigation of beryllium implanted P-type GaNen_US
dc.typeArticle; Proceedings Paperen_US

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