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次微米通信用高頻標準元晶片設計及測試(I)

dc.contributor.author吳介琮en_US
dc.contributor.authorWU JIEH-TSORNGen_US
dc.contributor.department國立交通大學電子工程系zh_TW
dc.date.accessioned2014-12-13T10:39:05Z
dc.date.available2014-12-13T10:39:05Z
dc.date.issued1996en_US
dc.description.sponsorship交通部zh_TW
dc.identifier.govdocTL-85-6104zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=251897&docId=46237en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/96058
dc.language.isozh_TWen_US
dc.subject超大型積體電路zh_TW
dc.subject數位類比混合式zh_TW
dc.subject細胞元資料庫zh_TW
dc.subject雙協助金屬氧化物半導體zh_TW
dc.subjectVery large scale integrated circuit(VLSI)en_US
dc.subjectDigital and analog mixed signalen_US
dc.subjectCell libraryen_US
dc.subjectBi-complementary metal oxide silicon(Bi-CMOS)en_US
dc.title次微米通信用高頻標準元晶片設計及測試(I)zh_TW
dc.titleDesign and Testing of Submicron High-Frequency Standard Cells for Telecommunications (I)en_US
dc.typePlanen_US

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