System for producing the parameters of a bass-enhanced loudspeaker enclosure
| dc.citation.patentcountry | USA | zh_TW |
| dc.citation.patentnumber | 20090214047 | zh_TW |
| dc.contributor.author | Bai, Ming-Sian R. | en_US |
| dc.contributor.author | Zhang, Huan-Sheng | en_US |
| dc.contributor.author | Chen, Rong-Liang | en_US |
| dc.date.accessioned | 2014-12-16T06:15:46Z | |
| dc.date.available | 2014-12-16T06:15:46Z | |
| dc.date.issued | 2009-08-27 | en_US |
| dc.description.abstract | A system for producing parameters for a bass-enhanced loudspeaker enclosure; meanwhile, a low-frequency extended frequency, a quality and quantity ratio and radius of a port need to be defined for the system. Also, the resonance frequency of a mechanical system and the quality and quantity of a mechanical system are fixed to obtain the parameters for the frequency ratio, the length of the duct and the cavity volume inside the device, etc. and to manufacture the bass-enhanced loudspeaker enclosure. | zh_TW |
| dc.identifier.govdoc | H04R029/00 | zh_TW |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/105496 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | System for producing the parameters of a bass-enhanced loudspeaker enclosure | zh_TW |
| dc.type | Patents | en_US |