Sequential Simulated Annealing System for Pattern Detection

Abstract

A sequential system is proposed by using simulated annealing for the detection of lines, circles, ellipses, and hyperbolas in image. The sequential detection procedures are type by type and patterns by patterns. The equation of ellipse and hyperbola is defined under translation and rotation. The distance from all points to all patterns is defined as the error. Using simulated annealing for parameter detection can search a set of parameter vectors for the global minimal error. We also propose synchronous simulated annealing detection system to compare with sequential system. In the experiments, using the sequential system, the result of a large number of simulated and real image patterns detection is better than that of using the synchronous system.