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近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(I)
近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(I)
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922212E009026.pdf
(232.68 KB)
Date
2003
Authors
尹慶中
YIN CHING-CHUNG
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https://www.grb.gov.tw/search/planDetail?id=863365&docId=164736
https://ir.lib.nycu.edu.tw/handle/11536/92479
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