Investigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Test
| dc.citation.epage | 937 | en_US |
| dc.citation.spage | 935 | en_US |
| dc.contributor.author | Tung, Chao-Ming | en_US |
| dc.contributor.author | Li, Yu-Tai | en_US |
| dc.contributor.author | Yang, Wei-Lun | en_US |
| dc.contributor.author | Wu, Hung-Sen | en_US |
| dc.contributor.author | Yu, Peichen | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.date.accessioned | 2018-08-21T05:56:42Z | |
| dc.date.available | 2018-08-21T05:56:42Z | |
| dc.date.issued | 2016-01-01 | en_US |
| dc.description.abstract | Accelerated methods for evaluating thermo humidity resistance of single-cell PV module are demonstrated with standard damp heat test (DH) and non-standard pressure cooker test (PCT). We investigated the failure mechanism of PCT. Our result shows testing under PCT more than 121 degrees C has fast degradation compared to other condition. | en_US |
| dc.identifier.issn | 0160-8371 | en_US |
| dc.identifier.journal | 2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/146531 | |
| dc.identifier.wosnumber | WOS:000399818700212 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Investigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Test | en_US |
| dc.type | Proceedings Paper | en_US |
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