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無須標定之感測器

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201035550zh_TW
dc.contributor.author孟心飛en_US
dc.contributor.author洪勝富en_US
dc.contributor.author趙宇強en_US
dc.contributor.author劉建成en_US
dc.contributor.author劉紋杏en_US
dc.contributor.author張正忠en_US
dc.contributor.author李振豪en_US
dc.contributor.author戴銘志en_US
dc.date.accessioned2014-12-16T06:12:39Z
dc.date.available2014-12-16T06:12:39Z
dc.date.issued2010-10-01en_US
dc.description.abstract一種無須標定之感測器,係包括:基板;形成於該基板上並相互間隔之第一電極和第二電極;以及形成於該基板上並與該第一電極和第二電極接觸之半導體層;其中,該半導體層具有複數個經官能化鍵結至該半導體層之探針基團,用以偵測與該探針基團具有專一性結合之物質。本發明之感測器利用探針基團鍵結至半導體層,並藉由電流變化測定與探針基團結合的物質,無須再使用螢光讀取設備讀取螢光訊號,具有即時測定、迅速、靈敏度高。zh_TW
dc.identifier.govdocG01N033/551zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103694
dc.language.isozh_TWen_US
dc.title無須標定之感測器zh_TW
dc.typePatentsen_US

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