非線性光學材料之線性光學特性之測量

dc.contributor.author	趙于飛	en_US
dc.contributor.department	國立交通大學光電工程研究所	zh_TW
dc.date.accessioned	2014-12-13T10:38:52Z
dc.date.available	2014-12-13T10:38:52Z
dc.date.issued	1996	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.identifier.govdoc	NSC85-2112-M009-041	zh_TW
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=235866&docId=43417	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/95823
dc.language.iso	zh_TW	en_US
dc.subject	橢圓儀	zh_TW
dc.subject	光譜儀	zh_TW
dc.subject	折射率	zh_TW
dc.subject	Ellipsometry	en_US
dc.subject	Spectrometry	en_US
dc.subject	Refractive index	en_US
dc.title	非線性光學材料之線性光學特性之測量	zh_TW
dc.title	Measurement on Optical Properties of Nonlinear Optical Materials by Ellipsometric Technique	en_US
dc.type	Plan	en_US

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