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Deposition of heteroepitaxial diamond on 6H-SiC single crystal by bias-enhanced microwave plasma chemical vapor deposition

dc.citation.epage289en_US
dc.citation.issue3-6en_US
dc.citation.spage283en_US
dc.citation.volume9en_US
dc.contributor.authorChang, Len_US
dc.contributor.authorYan, JEen_US
dc.contributor.authorChen, FRen_US
dc.contributor.authorKai, JJen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.date.accessioned2014-12-08T15:45:24Z
dc.date.available2014-12-08T15:45:24Z
dc.date.issued2000-04-01en_US
dc.description.abstractDeposition of heteroepitaxial diamond on substrates of 6H-SiC single crystal by a d.c. voltage biased-enhanced microwave plasma chemical vapor deposition method has been attempted. Various concentrations of methane (CH4) up to 10% in hydrogen (H-2) was used to evaluate its effect on epitaxy. Characterization of cross-sectional transmission electron microscopy with electron energy loss spectroscopy shows that an interlayer can form between diamond 6H-SiC, depending on the CH4 concentration. With low CH4 concentration, diamond was directly nucleated on 6H-SiC with an orientation relationship of diamond {111}//6H-SiC {0001} and diamond [110]//6H-SiC [11 (2) over bar 0]. (C) 2000 Elsevier Science S.A. All rights reserved.en_US
dc.identifier.doi10.1016/S0925-9635(99)00333-7en_US
dc.identifier.issn0925-9635en_US
dc.identifier.journalDIAMOND AND RELATED MATERIALSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0925-9635(99)00333-7en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/30589
dc.identifier.wosnumberWOS:000087382400011
dc.language.isoen_USen_US
dc.subjectbiasen_US
dc.subjectheteroepitaxyen_US
dc.subjectsilicon carbideen_US
dc.subjecttransmission electron microscopyen_US
dc.titleDeposition of heteroepitaxial diamond on 6H-SiC single crystal by bias-enhanced microwave plasma chemical vapor depositionen_US
dc.typeArticle; Proceedings Paperen_US

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