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雙位元儲存氮化矽快閃式記憶元件技術及可靠性(II)

dc.contributor.author汪大暉en_US
dc.contributor.authorWANG TAHUIen_US
dc.contributor.department交通大學電子工程系zh_TW
dc.date.accessioned2014-12-13T10:32:05Z
dc.date.available2014-12-13T10:32:05Z
dc.date.issued2004en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC93-2215-E009-023zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1026669&docId=195173en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/91361
dc.language.isozh_TWen_US
dc.title雙位元儲存氮化矽快閃式記憶元件技術及可靠性(II)zh_TW
dc.titleDual-bit Storage Nitride Trap Flash Memory Device Technology and Reliability(II)en_US
dc.typePlanen_US

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