Skip to main content
Log In
Communities & Collections
All of DSpace
Statistics
Home
學術出版;;Publications
研究計畫;;Research Plans
超薄氮化閘極氧化層奈米CMOS元件可靠性的新方法研究
超薄氮化閘極氧化層奈米CMOS元件可靠性的新方法研究
Loading...
Files
912215E009040.pdf
(666.66 KB)
Date
2002
Authors
莊紹勳
Chung Steve S
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
Abstract
Description
Keywords
Citation
URI
https://www.grb.gov.tw/search/planDetail?id=784389&docId=150766
https://ir.lib.nycu.edu.tw/handle/11536/93068
Collections
研究計畫;;Research Plans
Endorsement
Review
Supplemented By
Referenced By
Full item page
