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RLC effects on worst-case switching pattern for on-chip buses

dc.citation.epage948en_US
dc.citation.spage945en_US
dc.contributor.authorTu, SWen_US
dc.contributor.authorJou, JYen_US
dc.contributor.authorChang, YWen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:25:57Z
dc.date.available2014-12-08T15:25:57Z
dc.date.issued2004en_US
dc.description.abstractInductance effects on on-chip interconnects have become more and more significant in today's high-speed digital circuits, especially on global interconnects such as signal buses. However, most existing works consider only RC effects, e.g., the worst-case switching pattern resulting from coupling capacitance, to develop their encoding schemes to reduce bus delay. In this paper, we show that the worst-case switching patterns that incur the largest bus delay are completely different while considering RC and RLC effects. The finding implies that existing encoding schemes based on RC model might not improve or even worsen the bus delay when inductance effects become dominant.en_US
dc.identifier.journal2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 2, PROCEEDINGSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/18403
dc.identifier.wosnumberWOS:000223124000237
dc.language.isoen_USen_US
dc.titleRLC effects on worst-case switching pattern for on-chip busesen_US
dc.typeProceedings Paperen_US

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