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Rapid thermal chemical vapor deposition of nitrogen-doped polysilicon for high-performance and high-reliability CMOS technology

dc.citation.epage334en_US
dc.citation.spage329en_US
dc.citation.volume387en_US
dc.contributor.authorSun, SCen_US
dc.contributor.authorWang, LSen_US
dc.contributor.authorYeh, FLen_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.date.accessioned2014-12-08T15:27:45Z
dc.date.available2014-12-08T15:27:45Z
dc.date.issued1995en_US
dc.identifier.isbn1-55899-290-1en_US
dc.identifier.issn0272-9172en_US
dc.identifier.journalRAPID THERMAL AND INTEGRATED PROCESSING IVen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/20006
dc.identifier.wosnumberWOS:A1995BE31M00040
dc.language.isoen_USen_US
dc.titleRapid thermal chemical vapor deposition of nitrogen-doped polysilicon for high-performance and high-reliability CMOS technologyen_US
dc.typeProceedings Paperen_US

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