Reconfigurable switched- capacitor input circuit with digital-stimulus acceptability for analog tests
| dc.citation.patentcountry | USA | zh_TW |
| dc.citation.patentnumber | 20070063885 | zh_TW |
| dc.contributor.author | Hong, Hao-Chiao | en_US |
| dc.date.accessioned | 2014-12-16T06:16:07Z | |
| dc.date.available | 2014-12-16T06:16:07Z | |
| dc.date.issued | 2007-03-22 | en_US |
| dc.description.abstract | A reconfigurable switched-capacitor input circuit with digital-stimulus acceptability for analog tests disclosed in the present invention provides the digital input interfaces, which are comprised of capacitors, analog switches and digital circuits, for the usage of testing the mixed-signal circuits. The present invention provides a low-priced testing platform to accomplish the testing of circuits and to solve the problems of high-cost mixed mode tester and of utmost restrictions against the surrounding condition. Therefore, the present invention improves the testability, reduces the test cost, shorten the processes of designation and efficiently seize on the time-to-market. | zh_TW |
| dc.identifier.govdoc | H03M001/12 | zh_TW |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/105670 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | Reconfigurable switched- capacitor input circuit with digital-stimulus acceptability for analog tests | zh_TW |
| dc.type | Patents | en_US |