論均等論之比對方式--逐項測試法之優缺點探討
| dc.citation.epage | 425 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 397 | en_US |
| dc.citation.volume | 1 | en_US |
| dc.contributor.author | 陳志杰 | en_US |
| dc.contributor.author | 劉尚志 | en_US |
| dc.contributor.author | Chen, Chih-chieh | en_US |
| dc.contributor.author | Liu, Shang-jyh | en_US |
| dc.contributor.department | 科技法律研究所 | zh_TW |
| dc.contributor.department | Institute of Technology Law | en_US |
| dc.date.accessioned | 2014-12-19T03:51:03Z | |
| dc.date.available | 2014-12-19T03:51:03Z | |
| dc.date.issued | 2004 | en_US |
| dc.identifier.issn | 1811-3095 | en_US |
| dc.identifier.journal | 科技法學評論 | zh_TW |
| dc.identifier.uri | http://www.itl.nctu.edu.tw/tlr_n/ch/list1_2.html | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/107589 | |
| dc.subject | 均等論 | zh_TW |
| dc.subject | 非實質性差異 | zh_TW |
| dc.subject | 逐項測試法 | zh_TW |
| dc.subject | 整體觀察法 | zh_TW |
| dc.subject | 假想專利範圍 | zh_TW |
| dc.subject | Doctrine of equivalents | zh_TW |
| dc.subject | Insubstantial difference | zh_TW |
| dc.subject | Element-by-element test | zh_TW |
| dc.subject | Invention as a whole | zh_TW |
| dc.subject | Hypothetical patent claim | zh_TW |
| dc.title | 論均等論之比對方式--逐項測試法之優缺點探討 | zh_TW |