<link rel="stylesheet" href="styles.cf390c6bfbe7555f.css"> Skip to main content

Process for protecting solder joints and structure for alleviating electromigration and joule heating in solder joints

dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20060027933zh_TW
dc.contributor.authorChen, Chihen_US
dc.contributor.authorYeh, Everett Chang-Chingen_US
dc.contributor.authorTu, King-Ningen_US
dc.date.accessioned2014-12-16T06:16:14Z
dc.date.available2014-12-16T06:16:14Z
dc.date.issued2006-02-09en_US
dc.description.abstractThis invention provides a process for protecting solder joints, comprising forming an UBM or pad metallurgy in solder joints and then further forming a small solder bump on UBM or pad metallurgy between substrate and chip. Wherein a material of high electric resistance is coated at the ends of UBM or pad metallurgy where substrate is connected to chip, as to equalize the current distribution of solder bump, therefore the electromigration resistance of solder joints is improved by suppressing the current crowding and joule heating phenomenon.zh_TW
dc.identifier.govdocH01L023/48zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/105714
dc.language.isozh_TWen_US
dc.titleProcess for protecting solder joints and structure for alleviating electromigration and joule heating in solder jointszh_TW
dc.typePatentsen_US

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
20060027933.pdf
Size:
865.38 KB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed to upon submission
Description: