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用於擴散式光學斷層掃描之控制感測系統及其運作方法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201322961zh_TW
dc.contributor.author方偉騏en_US
dc.contributor.author陳殿河en_US
dc.contributor.author康適en_US
dc.contributor.author吳世揚en_US
dc.contributor.author鄭敬儒en_US
dc.date.accessioned2014-12-16T06:11:52Z
dc.date.available2014-12-16T06:11:52Z
dc.date.issued2013-06-16en_US
dc.description.abstract一種用於擴散式光學斷層掃描之控制感測系統及其運作方法,該控制感測系統包括控制單元及具有複數個光源和偵測器的感測電路,其中,每一光源的周圍係配設有對應的預定數量個偵測器,且複數個光源彼此的相對位置、複數個偵測器彼此的相對位置、各偵測器與各光源的相對位置係具有預定的距離。控制單元令複數個光源分別對一待測物發射光線,使待測物與光線反應以產生複數個光訊號,並令對應各該光源的預定數量個偵測器分別接收該些光訊號,並將該些光訊號傳輸至控制單元。藉此降低控制感測系統的複雜度,並達到微型化及低成本之功效。zh_TW
dc.identifier.govdocA61B008/13zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103262
dc.language.isozh_TWen_US
dc.title用於擴散式光學斷層掃描之控制感測系統及其運作方法zh_TW
dc.typePatentsen_US

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