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Self-calibrating high-speed analog-to-digital converter

dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber07474239zh_TW
dc.contributor.authorSuen_US
dc.contributor.authorChau-Chinen_US
dc.contributor.authorLuen_US
dc.contributor.authorHung-Wenen_US
dc.contributor.authorChien_US
dc.contributor.authorShun-Minen_US
dc.date.accessioned2014-12-16T06:14:29Z
dc.date.available2014-12-16T06:14:29Z
dc.date.issued2009-01-06en_US
dc.description.abstractIn a precisely self-calibrating high-speed analog to digital converter the aspect ratios of tri-state inverters are adjusted to fine-tune threshold voltage as comparators. And the multiplexers composed of tri-state inverters amplify the signal from the output of comparators. Their switches of tri-state inverters may be properly controlled to select the optimal channels and reduce unnecessary power consumption. The calibration circuitry utilizes under-sampling to calculate the duty cycles of comparators, selecting the optimal comparators and channels. By the way, the invention may avoid process variation.zh_TW
dc.identifier.govdocH03M001/12zh_TW
dc.identifier.govdocH03M001/06zh_TW
dc.identifier.govdocH03M001/10zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/104758
dc.language.isozh_TWen_US
dc.titleSelf-calibrating high-speed analog-to-digital converterzh_TW
dc.typePatentsen_US

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