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TRIAD: A Triple Patterning Lithography Aware Detailed Router

dc.citation.epage129en_US
dc.citation.spage123en_US
dc.contributor.authorLin, Yen-Hungen_US
dc.contributor.authorYu, Beien_US
dc.contributor.authorPan, David Z.en_US
dc.contributor.authorLi, Yih-Langen_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.date.accessioned2014-12-08T15:30:08Z
dc.date.available2014-12-08T15:30:08Z
dc.date.issued2012en_US
dc.description.abstractTPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG. This work proposes a token graph-embedded conflict graph (TECG) to facilitate the TPL conflict detection while maintaining high coloring-flexibility. We then develop a TPL aware detailed router (TRIAD) by applying TECG to a gridless router with the TPL stitch generation. Compared to a greedy coloring approach, experimental results indicate that TRIAD generates no conflicts and few stitches with shorter wirelength at the cost of 2.41 x of runtime.en_US
dc.identifier.isbn978-1-4503-1573-9en_US
dc.identifier.journal2012 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/21593
dc.identifier.wosnumberWOS:000317001300018
dc.language.isoen_USen_US
dc.titleTRIAD: A Triple Patterning Lithography Aware Detailed Routeren_US
dc.typeProceedings Paperen_US

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