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全晶片上寬工作電壓溫度製程電壓的感測系統

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI422847zh_TW
dc.contributor.author陳璽文en_US
dc.contributor.author張銘宏en_US
dc.contributor.author謝維致en_US
dc.contributor.author黃威en_US
dc.date.accessioned2014-12-16T06:13:54Z
dc.date.available2014-12-16T06:13:54Z
dc.date.issued2014-01-11en_US
dc.description.abstract本發明提供一種全晶片上寬工作電壓溫度製程電壓的感測系統,其係設置於一晶片上,該感測系統包含:一電壓感測裝置、一製程感測裝置、及一溫度感測裝置。其中,溫度感測裝置包含:一偏壓電流產生器、一環形振盪器、一固定脈衝產生器、一及閘、及一第一計數器。偏壓電流產生器依據晶片之工作電壓,而產生一與溫度相關之輸出電流。環形振盪器由輸出電流而產生一振盪訊號,固定脈衝產生器產生固定寬度之一脈衝訊號。第一及閘連接至環形振盪器及固定脈衝產生器,以對振盪訊號及脈衝訊號執行邏輯及運算,以產生一溫度感測訊號。zh_TW
dc.identifier.govdocG01R031/303zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/104409
dc.language.isozh_TWen_US
dc.title全晶片上寬工作電壓溫度製程電壓的感測系統zh_TW
dc.typePatentsen_US

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