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限制驅導排程方法在晶圓廠黃光區之應用

dc.contributor.author李榮貴en_US
dc.contributor.authorLI RONG-KWEIen_US
dc.contributor.department國立交通大學工業工程與管理學系zh_TW
dc.date.accessioned2014-12-13T10:38:15Z
dc.date.available2014-12-13T10:38:15Z
dc.date.issued2001en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC90-2218-E009-020zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=674289&docId=128525en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/95153
dc.language.isozh_TWen_US
dc.subject晶圓製造zh_TW
dc.subject光刻術zh_TW
dc.subject限制理論zh_TW
dc.subjectWafer fabricationen_US
dc.subjectPhotolithographyen_US
dc.subjectTheory of constrainten_US
dc.title限制驅導排程方法在晶圓廠黃光區之應用zh_TW
dc.titleAn Application of TOC for Photolithography Area in Wafer Fabrication Factoryen_US
dc.typePlanen_US

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