CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS
| dc.citation.epage | 64 | en_US |
| dc.citation.spage | 61 | en_US |
| dc.citation.woscount | 1 | en_US |
| dc.contributor.author | HUANG, CM | en_US |
| dc.contributor.author | WANG, TH | en_US |
| dc.contributor.author | CHEN, T | en_US |
| dc.contributor.author | PENG, NC | en_US |
| dc.contributor.author | CHANG, A | en_US |
| dc.contributor.author | SHONE, FC | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.date.accessioned | 2019-04-02T06:04:36Z | |
| dc.date.available | 2019-04-02T06:04:36Z | |
| dc.date.issued | 1995-01-01 | en_US |
| dc.identifier.journal | 1995 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 33RD ANNUAL | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/151140 | |
| dc.identifier.wosnumber | WOS:A1995BD05F00011 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS | en_US |
| dc.type | Proceedings Paper | en_US |
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