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以資料分析為導向之新型態電子設計自動化研究---子計畫六:應用於最低操作電壓認定與系統錯誤預測之資料探勘平台( I )

dc.contributor.author趙家佐en_US
dc.contributor.authorChao Mango Chia-Tsoen_US
dc.contributor.department國立交通大學電子工程學系及電子研究所zh_TW
dc.date.accessioned2014-12-13T10:49:46Z
dc.date.available2014-12-13T10:49:46Z
dc.date.issued2014en_US
dc.description.sponsorship科技部zh_TW
dc.identifier.govdocMOST103-2220-E009-015zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=8278859&docId=437538en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/101823
dc.language.isozh_TWen_US
dc.title以資料分析為導向之新型態電子設計自動化研究---子計畫六:應用於最低操作電壓認定與系統錯誤預測之資料探勘平台( I )zh_TW
dc.titleData Mining Platform for Vmin Identification and System Failure Prediction( I )en_US
dc.typePlanen_US

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