掃描探針式電子穿透顯微鏡組裝及表面物理研究(I)
| dc.contributor.author | 林登松 | en_US |
| dc.contributor.author | DENG-SUNGLIN | en_US |
| dc.contributor.department | 國立交通大學物理研究所 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:39:45Z | |
| dc.date.available | 2014-12-13T10:39:45Z | |
| dc.date.issued | 1995 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC84-2112-M009-031 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=160902&docId=26759 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/96782 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 掃描探針式電子穿透顯微鏡組裝及表面物理研究(I) | zh_TW |
| dc.title | Study of Semiconductor Surface and Thin Film Physics Using Ultra-High Vacuum Scanning Tunneling Microscopy (I) | en_US |
| dc.type | Plan | en_US |
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