Prediction of the BCI results For CAN Bus ECU using Incident Wave Excitation Method
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Lee, Wei Ting | en_US |
| dc.contributor.author | Chung, Yung Chi | en_US |
| dc.contributor.author | Chen, Chu Yu | en_US |
| dc.contributor.author | Tang, Jing Jou | en_US |
| dc.contributor.author | Yang, Chung Shun | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2015-12-02T03:00:58Z | |
| dc.date.available | 2015-12-02T03:00:58Z | |
| dc.date.issued | 2014-01-01 | en_US |
| dc.description.abstract | In this paper, a method called the incident wave excitation method is proposed to incorporate the effects of the coupling noise onto leads of the CAN bus. The equivalent circuit model for two wires (CAN high line and CAN low line) system is firstly derived. The distributed voltage and current sources along the lead excited by the coupling noise can be computed. The set up for the ISO bulk-current injection (BCI) measurement at the IC level is performed. The computed results will be further verified and compared with BCI specific experimental results. | en_US |
| dc.identifier.isbn | 978-1-4799-4851-2 | en_US |
| dc.identifier.issn | en_US | |
| dc.identifier.journal | 2014 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS - TAIWAN (ICCE-TW) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/128619 | |
| dc.identifier.wosnumber | WOS:000361019800082 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Prediction of the BCI results For CAN Bus ECU using Incident Wave Excitation Method | en_US |
| dc.type | Proceedings Paper | en_US |
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