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場效電晶體結構

dc.citation.patentcountryTWNen_US
dc.citation.patentnumber201739048en_US
dc.contributor.author張俊彥zh_TW
dc.date.accessioned2019-04-11T06:04:13Z
dc.date.available2019-04-11T06:04:13Z
dc.date.issued2017-11-01en_US
dc.description.abstract一種場效電晶體結構,包括:基底、內部閘極、絕緣層、半導體帶、閘介電絕緣結構以及閘導體結構。內部閘極包括位於基底上的層狀部以及自層狀部延伸的牆部。絕緣層位於內部閘極的層狀部上。半導體帶位於牆部與部分絕緣層上,其中半導體帶包括源極/汲極區以及與源極/汲極區相鄰的通道區。閘介電絕緣結構位於通道區上。閘導體結構位於閘介電絕緣結構上。zh_TW
dc.identifier.govdocH01L029/10en_US
dc.identifier.govdocH01L029/66en_US
dc.identifier.govdocH01L029/78en_US
dc.identifier.govdocH01L027/105en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/151402
dc.language.isozh_TWen_US
dc.title場效電晶體結構zh_TW
dc.typePatentsen_US

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