Impacts of NBTI on SRAM Array with Power Gating Structure
| dc.citation.epage | 77 | en_US |
| dc.citation.spage | 76 | en_US |
| dc.contributor.author | Yang, Hao-I | en_US |
| dc.contributor.author | Chuang, Ching-Te | en_US |
| dc.contributor.author | Hwang, Wei | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:20:11Z | |
| dc.date.available | 2014-12-08T15:20:11Z | |
| dc.date.issued | 2009 | en_US |
| dc.identifier.isbn | 978-1-4244-2784-0 | en_US |
| dc.identifier.journal | PROCEEDINGS OF TECHNICAL PROGRAM: 2009 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/14322 | |
| dc.identifier.wosnumber | WOS:000272451000033 | |
| dc.language.iso | en_US | en_US |
| dc.title | Impacts of NBTI on SRAM Array with Power Gating Structure | en_US |
| dc.type | Proceedings Paper | en_US |
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