Microcrystallinity of undoped amorphous silicon films and its effects on the transfer characteristics of thin film transistors
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Liang, CW | en_US |
| dc.contributor.author | Chiang, WC | en_US |
| dc.contributor.author | Feng, MS | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2019-04-02T06:04:36Z | |
| dc.date.available | 2019-04-02T06:04:36Z | |
| dc.date.issued | 1995-01-01 | en_US |
| dc.identifier.journal | PROCEEDINGS OF THE FOURTH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/151142 | |
| dc.identifier.wosnumber | WOS:A1995BF21N00076 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Microcrystallinity of undoped amorphous silicon films and its effects on the transfer characteristics of thin film transistors | en_US |
| dc.type | Proceedings Paper | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: