Transient-to-Digital Converter for ESD Protection Design in Microelectronic Systems

dc.citation.epage	408	en_US
dc.citation.spage	405	en_US
dc.contributor.author	Ker, Ming-Dou	en_US
dc.contributor.author	Yen, Cheng-Cheng	en_US
dc.contributor.author	Liao, Chi-Sheng	en_US
dc.contributor.author	Chen, Tung-Yang	en_US
dc.contributor.author	Tsai, Chih-Chung	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.date.accessioned	2014-12-08T15:03:56Z
dc.date.available	2014-12-08T15:03:56Z
dc.date.issued	2008	en_US
dc.description.abstract	An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-mu m CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.	en_US
dc.identifier.isbn	978-1-4244-2604-1	en_US
dc.identifier.journal	2008 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/2464
dc.identifier.wosnumber	WOS:000265155300102
dc.language.iso	en_US	en_US
dc.title	Transient-to-Digital Converter for ESD Protection Design in Microelectronic Systems	en_US
dc.type	Proceedings Paper	en_US

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