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薄膜電晶體結構及其製造方法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber00538529zh_TW
dc.contributor.author張國明en_US
dc.contributor.author鐘元鴻en_US
dc.date.accessioned2014-12-16T06:17:30Z
dc.date.available2014-12-16T06:17:30Z
dc.date.issued2003-06-21en_US
dc.description.abstract本案係為一種薄膜電晶體結構及其製造方法,其步驟包含提供一絕緣基板;於該絕緣基板上形成一源/汲極層、一主閘極絕緣層、以及一第一導體層;對該第一導體層進行蝕刻以定義出一主閘極導體結構;於該主閘極導體結構上依序形成一子閘極絕緣層及一第二導體層;以及對該第二導體層及該子閘極絕緣層進行蝕刻以定義出一第一子閘極導體結構、一第二子閘極導體結構、一第一子閘極絕緣層、以及一第二子閘極絕緣層。zh_TW
dc.identifier.govdocH01L027/01zh_TW
dc.identifier.govdocH01L027/01zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/106463
dc.language.isozh_TWen_US
dc.title薄膜電晶體結構及其製造方法zh_TW
dc.typePatentsen_US

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