以干涉相位測量法探討對掌物質的特性及其相關應用(III)
| dc.contributor.author | 蘇德欽 | en_US |
| dc.contributor.author | SU DER-CHIN | en_US |
| dc.contributor.department | 交通大學光電工程研究所 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:30:41Z | |
| dc.date.available | 2014-12-13T10:30:41Z | |
| dc.date.issued | 2005 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC94-2215-E009-002 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1143827&docId=219361 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/90378 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 以干涉相位測量法探討對掌物質的特性及其相關應用(III) | zh_TW |
| dc.title | Studies on the Characteristics of Chiral Materials with Interferometric Phase Measurement Techniques and Associated Applications(III) | en_US |
| dc.type | Plan | en_US |