Oscillator based on a 6T SRAM for measuring the Bias Temperature Instability
| dc.citation.patentcountry | USA | zh_TW |
| dc.citation.patentnumber | 20130222071 | zh_TW |
| dc.contributor.author | Chuang Ching-Te | en_US |
| dc.contributor.author | Jou Shyh-Jye | en_US |
| dc.contributor.author | Hwang Wei | en_US |
| dc.contributor.author | Tsai Ming-Chien | en_US |
| dc.contributor.author | Lin Yi-Wei | en_US |
| dc.contributor.author | Yang Hao-I | en_US |
| dc.contributor.author | Tu Ming-Hsien | en_US |
| dc.contributor.author | Shih Wei-Chiang | en_US |
| dc.contributor.author | Lien Nan-Chun | en_US |
| dc.contributor.author | Lee Kuen-Di | en_US |
| dc.date.accessioned | 2014-12-16T06:14:56Z | |
| dc.date.available | 2014-12-16T06:14:56Z | |
| dc.date.issued | 2013-08-29 | en_US |
| dc.description.abstract | The present invention provides an oscillator which is based on a 6T SRAM for measuring the Bias Temperature Instability. The oscillator includes a first control unit, a first inverter, a second control unit, and a second inverter. The first control unit is coupled with the first inverter. The second control unit is coupled with the second inverter. The first control unit and the second control unit is used to control the first inverter and the second inverter being selected, biased, and connected respectively, so that the NBTI and the PBTI of the SRAM can be measured separately, and the real time stability of the SRAM can be monitored immediately. | zh_TW |
| dc.identifier.govdoc | H03K003/36 | zh_TW |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/105006 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | Oscillator based on a 6T SRAM for measuring the Bias Temperature Instability | zh_TW |
| dc.type | Patents | en_US |