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射頻電路系統前瞻測試技術開發(III)

dc.contributor.author蘇朝琴en_US
dc.contributor.authorSU CHAU-CHINen_US
dc.contributor.department交通大學電機與控制工程系zh_TW
dc.date.accessioned2014-12-13T10:31:21Z
dc.date.available2014-12-13T10:31:21Z
dc.date.issued2005en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC94-2215-E009-079zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1144047&docId=219425en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/90867
dc.language.isozh_TWen_US
dc.title射頻電路系統前瞻測試技術開發(III)zh_TW
dc.titleAdvanced Test Technology Development for RF Circuits and Systems(III)en_US
dc.typePlanen_US

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