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單晶片系統驗證之核心技術開發---子計畫三:以特性為基礎之功能驗證與錯誤診斷(III)

dc.contributor.author黃俊達en_US
dc.contributor.authorHuang Juinn-Daren_US
dc.contributor.department國立交通大學電子工程學系及電子研究所zh_TW
dc.date.accessioned2014-12-13T10:28:29Z
dc.date.available2014-12-13T10:28:29Z
dc.date.issued2007en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC96-2220-E009-009zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1464357&docId=262478en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/88362
dc.language.isozh_TWen_US
dc.title單晶片系統驗證之核心技術開發---子計畫三:以特性為基礎之功能驗證與錯誤診斷(III)zh_TW
dc.titleProperty-Based Functional Verification and Error Diagnosis(III)en_US
dc.typePlanen_US

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